Characterization of high-purity germanium detectors with amorphous germanium contacts in cryogenic liquids
R. Panth (University of South Dakota, 414 East Clark Street, Vermillion, SD, 57069, USA); J. Liu (University of South Dakota, 414 East Clark Street, Vermillion, SD, 57069, USA); I. Abt (Max-Planck-Institut für Physik, Föhringer Ring 6, Munich, 80805, Germany); X. Liu (Max-Planck-Institut für Physik, Föhringer Ring 6, Munich, 80805, Germany); O. Schulz (Max-Planck-Institut für Physik, Föhringer Ring 6, Munich, 80805, Germany); et al - Show all 9 authors
For the first time, planar high-purity germanium detectors with thin amorphous germanium contacts were successfully operated directly in liquid nitrogen and liquid argon in a cryostat at the Max-Planck-Institut für Physics in Munich. The detectors were fabricated at the Lawrence Berkeley National Laboratory and the University of South Dakota, using crystals grown at the University of South Dakota. They survived long-distance transportation and multiple thermal cycles in both cryogenic liquids and showed reasonable leakage currents and spectroscopic performance. Also discussed are the pros and cons of using thin amorphous semiconductor materials as an alternative contact technology in large-scale germanium experiments searching for physics beyond the Standard Model.
