The background field method and critical vector models
Mikhail Goykhman (The Racah Institute of Physics, The Hebrew University o f Jerusalem, Jerusalem, 91904, Israel); Vladimir Rosenhaus (School of Natural Sciences, Institute for Advanced Study, 1 Einstein Drive, Princeton, NJ, 08540, USA, Initiative for the Theoretical Sciences, The Graduate Center, City University of New York, 365 Fifth Ave, New York, NY, 10016, USA); Michael Smolkin (The Racah Institute of Physics, The Hebrew University o f Jerusalem, Jerusalem, 91904, Israel)
We use the background field method to systematically derive CFT data for the critical ϕ 6 vector model in three dimensions, and the Gross-Neveu model in dimensions 2 ≤ d ≤ 4. Specifically, we calculate the OPE coefficients and anomalous dimensions of various operators, up to next-to-leading order in the 1/N expansion.
